Solid State Chemistry

Methodology

  • Powder X-ray diffraction (Cu Kα1) in transmission and reflection geometry with linear, position-sensitive, and image-plate detectors between -170 and 950°C
  • Scanning electron microscopy (SEM) with options for back scattering, stereo images, elemental analysis (EDS), and image processing
  • Thermal gravimetry (TG, SDTA) between 50 and 1100°C
  • Differential scanning calorimetry (DSC) between -150 and 700°C
  • Electron paramagnetic resonance (EPR) in the X- and Q-bands between 2 and 300 K
  • Magnetic measurements (SQUID) between 1.8 and 300 K and up to 5 Tesla
  • Crystal orientation by X-ray diffraction in reflection geometry
  • Metal sputtering equipment

 

Applications

  • Investigation of powder samples by X-ray diffraction:
    indexing, lattice parameters, structure refinement (Rietveld), analysis of mixed phases, thermal expansion, phase transitions
  • Electron microscopy:
    SEM pictures, phase analysis, elemental distribution, surface roughness
  • Thermal analysis:
    melting points, phase transitions, decomposition temperatures
  • Characterization of magnetic materials by EPR, susceptibility, and magnetization measurements
  • Orientation of crystals for optical measurements, neutron scattering, etc.

 

Contact